XT suite of programs enhances the XT range of electronics X-ray and industrial CT systems’ speed and functionality
Nikon Metrology announces the release of XT Software Suite v2.2, the latest version of the control and analysis software for its range of industrial X-ray systems. The XT Software Suite combines Inspect-X and CT-Pro into a single suite of programs to enhance the speed and functionality of the Nikon Metrology XT range of X-ray microscopes and CT systems. This software builds on Nikon
Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users.
Batch CT function increases throughput
In order to improve the throughput of CT samples, the XT Software Suite v2.2 includes a Batch CT function whereby a number of samples can be loaded and their individual settings stored. The system can then collect the data in a single run without further user intervention, allowing better system use with overnight runs of multiple samples.
Nikon Metrology also improved profile and file handling to make sure that all of the key information for each scan is easily accessible with the data.
Time saving features for electronics X-ray
Following suggestions from the electronics market, a number of improvements have been made to the electronics tools. Firstly, the ability to measure multiple bond wires in a single image, thus speeding up throughput of samples requiring bond wire measurement. Secondly, the flux calibration feature, which is needed for accurate inspections, has been improved to allow multiple recalibration of the flux calibrations after a filament change to further shorten the down time due to filament change. Finally in the electronics area, the text handling has been improved to provide increased flexibility in font size to make the final images clearer and avoid errors in interpretation.
3D CT made faster and even more accurate
Following on from the 2D CT automated beam hardening tool introduced in v2, the XT Software Suite v2.2 extends this tool into 3D CT. Now, it allows for the automatic correction of single material beam hardening to improve accuracy and measurement.
Last but not least, this latest version also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs.
ABOUT NIKON METROLOGY
Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircrafts. Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time. Further information is available on www.nikonmetrology.com.
For further information please contact:
Renaat Van Cauter
Director Marketing Communications
Nikon Metrology NV
B3001 Leuven, Belgium
Tel +32 16 74 01 00