Media Alert: AWR Exhibits, Presents, and Gifts Software at IEEE IWS 2013

EL SEGUNDO, Calif. – April 3, 2013  

What:

AWR will be showcasing in Booth #1617 at the International Wireless Symposium (IWS2013) on April 16-18 its first new release in 2013 of the AWR Design Environment™, inclusive of Microwave Office®/ Analog Office® circuit design software and Visual System Simulator™ (VSS) system design software, as well as AXIEM® 3D planar electromagnetic (EM) software and Analyst™ 3D finite element method (FEM) EM software. The company will also be demonstrating joint hardware/software solutions with parent company National Instruments.

In addition to software demonstrations within booth #1617, AWR will present the following papers at the Industrial Forum on Thursday April 18th beginning at 10:00am:

  • A Novel Design Methodology for MMIC Applications, Dr. Milton Lien, AWR
  • Design and Simulation of Modern Radar Systems, Peter Xu, AWR
  • Linking RF Design and Test - Connecting RF Design Software to LabVIEW & Modular Instruments, Yuan Yao, National Instruments, and Yufu Li, AWR

AWR, a silver sponsor at this event, will also be awarding both cash and in-kind software contribution prizes to the winning teams of the IWS Student Paper Competition. The presentation ceremony will be held Monday evening, April 15th.

Where: 
IWS 2013, Beijing, China

For more information about AWR’s activities at IWS 2013 and the detailed schedule of AWR conference papers and speaking engagements, please visit http://www.awrcorp.com/news/events/event/iws-2013

When:  
April 15-18, 2013

###

© 2013 AWR Corporation. All rights reserved. AWR, Microwave Office, Analog Office, and AXIEM are registered trademarks and the AWR logo, Visual System Simulator, Analyst, and the AWR Design Environment are trademarks of AWR Corporation. Other product and company names listed are trademarks or trade names of their respective companies.

Contact:

    Sherry Hess
    AWR Corporation
    Vice President of Marketing
    (310) 726-3000
     Email Contact

 




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