MILPITAS, Calif. — (BUSINESS WIRE) — June 26, 2012 — Nanometrics Incorporated (NASDAQ: NANO), a leading provider of advanced process control metrology and inspection systems, today announced that its SPARK-API macro defect inspection system has been qualified by a leading device manufacturer in Asia for advanced 2X nm devices. The system is being used in the development of advanced 3D wafer-scale packaging (WSP) processes for next-generation memory and logic devices, which are currently scheduled for high-volume production later this year.
The SPARK-API was qualified at multiple inspection steps, including bonding quality, wafer thinning and backside processing for through-silicon via (TSV) applications. “The SPARK was selected for its versatility to address the wide range of process control inspection needs in this emerging segment of WSP,” commented Lars Markwort, vice president of the Inspection Business Unit at Nanometrics. “The SPARK platform ideally meets the high-volume manufacturing needs of 3D-WSP with its high throughput and low cost of ownership enabled by capturing a full wafer image in a single ‘shot.’ The SPARK’s unique technology detects both large-area and small particle defects, as well as residue from previous process steps and voids in the bond layer from improper bonding.”
“We are pleased to have our SPARK-API system selected by one of our leading customers, along with the opportunity to work with an industry leader on this rapidly emerging new technology,” commented Tim Stultz, president and chief executive officer of Nanometrics. “This latest selection further advances our strategy to expand our served markets by entering the inspection market as well as to increase our participation in growth segments such as 3D device integration. The SPARK system highly complements the position we have established with our UniFire® system for TSV, micro-bump and advanced metallization process control, providing a comprehensive, end-to-end solution for our customers and their emerging applications in 3D-WSP.”
The SPARK can be deployed for macro defect inspection across semiconductor manufacturing lines, providing cost-effective and extendible technology for mask, wafer backside, lithography, and wafer-scale packaging. When used alongside, or combined on the Lynx™ platform with other Nanometrics solutions for critical dimension, overlay and topography, manufacturers can achieve the lowest cost of ownership, highest information throughput and smallest fab footprint for advanced process control metrology and inspection.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.
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